| Warranty: | 1 Year |
|---|---|
| Type: | Metallographic |
| Number of Cylinder: | ≥Three |
| Mobility: | Desktop |
| Stereoscopic Effect: | N/a |
| Shape: | N/a |
| Samples: |
|---|
| Customization: |
|---|
Suppliers with verified business licenses
Audited Supplier
Adhering to the philosophy of continuous exploration&self-transcending for MSS, new SY61N metallurgicalmicroscope for research with a number of pioneering designin appearance and functions, is born to provide a perfectdetection solution and develop a new pattern of industrial field.
Viewing head with multi-splitting ratio
SY61N viewing head is designed of multiple options for splitting ratio. With widebeam imaging system, 26.5mm super wide filed of view is available.
Trinocular head with erect image, splitting ratio Binocular:Trinocular= 100:0 or 0:100.The moving direction of samples is as the same as observed.
Trinocular head with inverted image, splitting ratio Binocular: Trinocular=100:0 or 20:80or 0:100. Except for concentrating 100% light to eyepiece tube or camera tube, thereis another option with 20% light to eyepiece tube and 80% to camera tube, so thateyepiece observation and image output can be available at the same time.
Polarization system
The polarizer and analyzer in polarization system contribute to eliminate the stray lightin semiconductor and PCB detection, image with clear detail is achievable. Thereare fixed analyzer and rotatable analyzer for option. The sample can be observedat different polarizing angles with 360.rotatable analyzer. Besides, this polarizationsystem can be upgraded to Nomarski differential interference contrast system afterinstalling a new developed DIC attachment.
Nomarski differential interference contrast system
The weeny asperities on the surface which can not be found in bright field, is able tobe detected by using U-DICR attachment to create high contrast background. It iswidely used for testing the conductive particle of LCD, surface scratch of precisiondisk.
Linkage between the neutral density filter and the switch for BF & DF
The lever in front of illuminator is used to switch between bright field and dark field,and it is in tandem with a neutral density filter (ND61). When you switch from DF toBF, the built-in ND61 filter takes the role to decay the light intensity. More scientificand more comfortable.
Optional nosepieces
The included angle between optical axis and rotation axis of multiple nosepiece isdecreased to 15°. It is helpful to improve the accuracy of centering and focusing. Sevenobjectives at most can be assembled at the same time. Continuous and reasonablemagnifications from low to high is achievable.
Ergonomic design
The intensity can be flexibly adjusted by the dimming device which is located on theright side of frame. The voltage change all-digital displays. Adjusting intensity and coaxialfocusing at the same time, improves the work efficiency.
Reflected or transmitted illumination can be switched by the button on the digitaldimming display. Using the RE-SET button to keep the light intensity at around 8V (witha camera mark on the dimming display) which is an optimal voltage for photomicrography.Four built-in filter holders with three standard filters, one empty holder for optionalfilter. All the filters can be moved out the optical path by pulling out the lever.
Low position coaxial focusing system with tension adjustment. The coarse range is25mm and the fine precision is 0.001mm. The height of a tiny sample,such as solder ball,can be measured.
Stage with adjustment on the right hand
4 inches double-layer mechanical stage, with the lock device to limit Y axis movement. Itis widely used in horizontal detection to avoid missing.
Glass plate is attachable for transmitted light.
Transmitted and reflected illuminator
Suppliers with verified business licenses
Audited Supplier 
){kind=link}
){kind=link}